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【Domestic News】Professor Liu Bo's team from Tongji University:High-resistivity β-Ga₂O₃: Al single crystal and its X-ray detector Obtained by using the band-gap engineering

日期:2023-10-11阅读:175

      Recently, the research team of Professor Liu Bo from Tongji University proposed a design strategy for a high-performance X-ray detector based on β-Ga2O3: Al single crystal, and grew high-quality β-Ga2O3: Al single crystal by optical floating zone method. The prepared X-ray detector based on Ga2O3:15%Al has the advantages of high sensitivity, high response speed and low detection limit. The related research result is published in ACS Applied Electronic Materials, titled “Band gap engineering in β-Ga2O3 for a high-performance X-ray detector”.

Abstract

      Ga2O3 has an ultra-broadband gap, high breakdown electric field and high X-ray absorption coefficient, which has attracted great attention in the field of X-ray detection. However, unintentional doped Ga2O3 tend to have low resistivity because of the shallow donor energy level caused by the impurity elements or the intrinsic defects. Doping of iron and magnesium ions can improve the resistivity of β-Ga2O3. However, due to the introduction of deep-level impurities, the carrier drift length and the carrier collection efficiency are greatly reduced. In this paper, the researchers obtained a high resistivity β-Ga2O3: Al single crystal by band gap engineering. Meanwhile, the mechanism of Al3+ doping on improving the resistivity of β-Ga2O3 crystal is discussed, and an X-ray detector based on β-Ga2O3:15%Al is developed. The detector has a high sensitivity of 851.6 μC·Gyair1·cm2, which is 42 times the sensitivity of the commercial amorphous selenium X-ray detector. Moreover, the detector has a fast response speed and a rise time and decay time of less than 0.05s. It was found that the high performance of the X-ray detector based on the β-Ga2O3:15%Al is attributed to the high resistivity and high quality of the β-Ga2O3: Al crystal. This paper provides a method to obtain a high-performance X-ray detector based on a β-Ga2O3 single crystal by band gap engineering.

DOI: 10.1021/acsaelm.1c00778